Perich G., Turkoglu M. O., Graf L. V., Wegner J. D., Aasen H., Walter A., Liebisch F.

Pixel-based yield mapping and prediction from Sentinel-2 using spectral indices and neural networks.

Field Crops Research, 292, 2023, 1-13.

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ISSN Print: 0378-4290
Digital Object Identifier (DOI): https://doi.org/10.1016/j.fcr.2023.108824
Publikations-ID (Webcode): 52331 Per E-Mail versenden

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